Decimal Testcases, version 2.09
Copyright (c) IBM Corporation, 2002. All rights reserved.
3 Nov 2002
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Appendix A Changes

This appendix lists changes since the first public draft of this document.

Changes in Draft 0.18 (13 July 2001)

Changes in Draft 0.20 (25 September 2001)

Changes in Version 1.00 (21 November 2001)

The specification has been enhanced to include tests for extended value arithmetic (including subnormal values and values such as NaN and Infinity). In particular:

Changes in Version 1.02 (30 November 2001)

Changes in Version 1.03 (20 March 2002)

Changes in Version 2.01 (3 July 2002)

This version marks a major update of the testcases to match the new combined arithmetic specification. The underlying syntax, etc., of the testcases is unchanged, but specific changes include:

Changes in Version 2.06 (1 September 2002)

This version incorporates updates to testcases for subnormal numbers (previous testcases included subnormals which were more precise than allowed by IEEE 854), and also adds testcases for rounding to-number conversions. The subnormal condition has been added, and subnormal numbers may be rounded and/or inexact (in the latter case, underflow is raised).

In this document:

Changes in Version 2.09 (8 October 2002)


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